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Microfocusing of 50 keV undulator radiation with two stacked zone plates

机译:用两个堆叠的波带片对50 keV起伏器辐射进行微聚焦

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摘要

The limitations of current fabrication methods preclude producing an efficient Fresnel phase zone plate optimized for focusing high-energy (>40 keV) synchrotron X-ray beams. To get around this difficulty, one can attempt a multiple zone plate setup that distributes the focusing task among more than one element, each of which can be manufactured. The focusing of 50 kev undulator radiation to a 9×7 μm~(2) spot size with a flux density gain of 24 was achieved using two stacked zone plates precisely aligned with respect to each other. The instrument was used to record elemental concentration maps of a geological inclusion specimen using X-ray fluorescence. The stacked zone plate approach is a viable option for microfocusing high-energy X-rays.
机译:当前制造方法的局限性在于无法生产出一种有效的菲涅耳相位波带片,该片经过优化后可以聚焦高能(> 40 keV)的同步加速器X射线束。为了解决这一难题,可以尝试进行多区板设置,以将聚焦任务分配到一个以上的元件中,每个元件都可以制造。使用两个彼此精确对准的堆叠波带片,将50 kev波动波的辐射聚焦到通量密度增益为24的9×7μm〜(2)点尺寸。该仪器用于使用X射线荧光记录地质包裹体标本的元素浓度图。堆叠波带片方法是微聚焦高能X射线的可行选择。

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