首页> 外文期刊>Optics Letters >Optical investigation of band-edge structure and built-in electric field of AlGaN/GaN heterostructures by means of thermoreflectance, photoluminescence, and contactless electroreflectance spectroscopy
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Optical investigation of band-edge structure and built-in electric field of AlGaN/GaN heterostructures by means of thermoreflectance, photoluminescence, and contactless electroreflectance spectroscopy

机译:通过热反射,光致发光和非接触电反射光谱法对AlGaN / GaN异质结构的带边结构和内置电场进行光学研究

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摘要

The band-edge property and built-in electric fields of two different Al_(x)Ga_(1-x)N/GaN (AlGaN/GaN) hetero-structures (HSs) with and without an additional AlGaN inserted layer were studied by thermoreflectance (TR), photoluminescence (PL), and contactless electroreflectance (CER) techniques. The PL spectra characterize the band-edge luminescence property of GaN. Free exciton transitions of AlGaN and GaN were probed experimentally by TR. Prominent Franz-Keldysh oscillations (FKOs) of GaN and the opposite FKO phase of AlGaN were simultaneously detected by the additional AlGaN inserted sample with CER owing to the enhancement effect of built-in electric fields of GaN and AlGaN with the same polarity direction. Optoelectronics properties of the two HSs were characterized by the experimental analyses.
机译:通过热反射研究了两种不同的Al_(x)Ga_(1-x)N / GaN(AlGaN / GaN)异质结构(HSs)在具有和不具有额外的AlGaN插入层的情况下的带边特性和内置电场(TR),光致发光(PL)和非接触电反射(CER)技术。 PL光谱表征了GaN的带边发光特性。 TR实验研究了AlGaN和GaN的自由激子跃迁。由于具有相同极性方向的GaN和AlGaN的内置电场的增强作用,额外的带有CER的AlGaN插入样品同时检测到GaN的明显Franz-Keldysh振荡(FKO)和AlGaN的相反FKO相。通过实验分析表征了两个HS的光电特性。

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