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首页> 外文期刊>Optics Letters >Double-exposure heterodyne imaging for observing line-of-sight deformation
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Double-exposure heterodyne imaging for observing line-of-sight deformation

机译:双曝光外差成像,用于观察视线变形

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摘要

An optical heterodyne array imaging system is described for double-exposure interferometric measurement of objects that change because of stress or vibration. The signal measurement and processing approach is summarized, and the method is demonstrated in the laboratory. An advantage of this technique over other electronic interferometric imaging methods is that complex exposures are created with digital phase and amplitude values at each image pixel. In addition, measurement of object deformation does not require time synchronization between the camera exposure time, or laser pulse time, and object vibration frequency.
机译:描述了一种光学外差阵列成像系统,用于对由于应力或振动而变化的物体进行两次曝光干涉测量。总结了信号测量和处理方法,并在实验室中进行了演示。该技术相对于其他电子干涉成像方法的优势在于,在每个图像像素处都会产生具有数字相位和幅度值的复杂曝光。另外,物体变形的测量不需要照相机曝光时间或激光脉冲时间与物体振动频率之间的时间同步。

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