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首页> 外文期刊>Optics Letters >Differential phase measurements in low-coherence interferometry without 2π ambiguity
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Differential phase measurements in low-coherence interferometry without 2π ambiguity

机译:低相干干涉测量中的相位差测量,没有2π歧义

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摘要

Quantitative phase measurements by low-coherence interferometry and optical coherence tomography are restricted by the well-known 2π ambiguity to path-length differences smaller than λ/2. We present a method that overcomes this ambiguity. Introducing a slight dispersion imbalance between reference and sample arms of the interferometer causes the short and long wavelengths of the source spectrum to separate within the interferometric signal. This causes the phase slope to vary within the signal. The phase-difference function between two adjacent sample beam components is calculated by subtraction of their phase functions obtained from phase-sensitive interferometric signal recording. Because of the dispersive effect, the phase difference varies across the interferometric signal. The slope of that phase difference is proportional to the optical path difference, without 2π ambiguity.
机译:通过低相干干涉测量法和光学相干断层扫描技术进行的定量相位测量受到众所周知的2π模糊度的限制,使其光程差小于λ/ 2。我们提出了一种克服这种歧义的方法。在干涉仪的参考臂和采样臂之间引入轻微的色散失衡会导致源光谱的短波长和长波长在干涉信号内分离。这导致相位斜率在信号内变化。通过减去从相敏干涉信号记录中获得的两个相邻采样光束分量之间的相位函数,可以计算出它们之间的相位差函数。由于色散效应,整个干涉测量信号的相位差都会变化。该相位差的斜率与光程差成正比,没有2π歧义。

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