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Refractive microlens array for wave-front analysis in the medium to hard x-ray range

机译:折射微透镜阵列,用于中硬X射线范围的波前分析

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摘要

We report an alternative approach to x-ray wave-front analysis that uses a refractive microlens array as a Shack-Hartmann sensor. The sensor was manufactured by self-assembly and electroplating techniques and is suitable for high-resolution wave-front analysis of medium to hard x rays. We demonstrate its effectiveness at an x-ray energy of 3 keV for analysis of x-ray wave-front perturbations caused by microscopic objects. The sensor has potential advantages over other methods for x-ray phase imaging and will also be useful for the characterization of x-ray beams and optics.
机译:我们报告了使用折射微透镜阵列作为Shack-Hartmann传感器的X射线波前分析的替代方法。该传感器是通过自组装和电镀技术制造的,适用于中硬x射线的高分辨率波前分析。我们证明了其在3 keV的X射线能量下的有效性,用于分析由微观物体引起的X射线波前摄动。与其他用于X射线相位成像的方法相比,该传感器具有潜在的优势,并且还将用于X射线束和光学器件的表征。

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