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首页> 外文期刊>Optical review >Simultaneous measurement of refractive index and thickness by low coherence interferometry considering chromatic dispersion of index [Review]
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Simultaneous measurement of refractive index and thickness by low coherence interferometry considering chromatic dispersion of index [Review]

机译：考虑相干色散的低相干干涉法同时测量折射率和厚度

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摘要

Low coherence interferometry can provide simultaneous measurement of refractive index n and thickness t of a transparent plate, as reported recently by some research groups. Precise measurement of n and t is impossible unless chromatic dispersion of index is taken into account. We then proposed and demonstrated a unique technique for simultaneous measurement of phase index n(p), group index n(g) and thickness t using a special sample holder. This paper describes a novel technique for simultaneous measurement of n(p), n(g) and t using an approximate expression of the chromatic dispersion in terms of n,. The approximate expression of chromatic dispersion does not require use of the special sample holder, and n(p), n(g) and t are determined from two measurable quantities with an accuracy of 0.3% or less, for the sample thickness was around 1 mm. In addition, it is possible to shorten the measurement time compared with the above method. [References: 12]
机译：正如一些研究小组最近报道的那样，低相干干涉测量法可以同时测量透明板的折射率n和厚度t。除非考虑索引的色散，否则无法精确测量n和t。然后，我们提出并演示了一种独特的技术，可使用特殊的样品架同时测量相指数n（p），组指数n（g）和厚度t。本文介绍了一种新的技术，用于同时测量n（p），n（g）和t的色散，该色散的近似表达式为n ，。色散的近似表达式不需要使用特殊的样品架，并且n（p），n（g）和t由两个可测量的量确定，精度为0.3％或更小（样品厚度约为1％）毫米另外，与上述方法相比，可以缩短测量时间。 [参考：12]

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