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Application of microscope thermography in testing temperature distribution in a semiconductor laser

机译:显微镜热成像技术在半导体激光器温度分布测试中的应用

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摘要

Microscope thermography with the use of thermovision camera with spatial resolution 8μm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices
机译:使用具有8μm空间分辨率的热成像摄像机的显微镜热成像技术来测试基于氮化物的半导体激光器的温度分布。进行的测试表明,显微镜热成像技术具有表征半导体激光二极管等微电子设备的潜力,可以被视为建立这些设备热特性的补充工具。

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