Ocean Optics to Provide Fully Integrated Metrology Systems

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Ocean Optics to Provide Fully Integrated Metrology Systems

机译：海洋光学将提供完全集成的计量系统

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Ocean Optics Inc.(Dunedin,Florida)has announced that it will offer fully integrated metrology systems complemented by sophisticated software and applications database support.Ocean Optics now offers PlasCalc,an optical emission spectrometer and control system for monitoring and controlling plasma processes;SpecEl,an ellipsometry tool for analyzing the thickness of optical layers from 10 nanometers to 250 microns;and the LTP Long Trace Profilometer,an interferomefric optical profiling instrument for absolute figure measurement of optical components up to 1,500 millimeters in diameter.

机译：海洋光学公司（佛罗里达州达尼丁）宣布将提供完全集成的计量系统，并辅以完善的软件和应用程序数据库支持。海洋光学公司现在提供PlasCalc，一种用于监测和控制等离子体过程的光学发射光谱仪和控制系统; SpecEl，椭圆仪用于分析从10纳米到250微米的光学层的厚度; LTP Long Trace轮廓仪，用于对直径最大1,500毫米的光学组件进行绝对图形测量的干涉测量光学轮廓仪。

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《Sea Technology: Worldwide Information Leader for Marine Business, Science & Engineering》 |2004年第10期|共2页
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机译：海洋光学将提供完全集成的计量系统
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Ocean Optics to Provide Fully Integrated Metrology Systems

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