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Inclusions of carbon in ingots of silicon carbide grown by the modified Lely method

机译:通过改进的Lely方法生长的碳化硅锭中的碳夹杂物

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摘要

The problem of the appearance of carbon inclusions in single-crystal silicon carbide ingots grown by the modified Lely method (the so-called graphitization of the ingot) is analyzed. It is shown that the process of graphitization of the ingot is not related to a deficit of silicon in the growth cell; in contrast, it is excess of silicon at the growth surface that inhibits the ingot growth rate and gives rise to intense corrosion of the graphite fittings.
机译:分析了通过改进的Lely方法生长的单晶碳化硅锭中的碳夹杂物的出现问题(所谓的锭的石墨化)。结果表明,铸锭的石墨化过程与生长池中硅的缺乏无关。相反,在生长表面上过量的硅会抑制铸锭的生长速率并导致石墨配件的强烈腐蚀。

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