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Antimony segregation in stressed SiGe heterostructures grown by molecular beam epitaxy

机译:分子束外延生长应力硅锗异质结构中的锑偏析

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摘要

The effects of the growth temperature, composition, and elastic strains in separate layers on the segregation of antimony are studied experimentally for stressed SiGe structures grown by molecular beam epitaxy. It is established that the growth conditions and parameters of the structures exert an interrelated influence on the segregation of Sb: the degree of the influence of the composition and elastic stresses in the SiGe layers on Sb segregation depends on the growth temperature. It is shown that usage of a method previously proposed by us for the selective doping of silicon structures with consideration for the obtained dependences of Sb segregation on the growth conditions and parameters of the SiGe layers makes it possible to form SiGe structures selectively doped with antimony.
机译:对于通过分子束外延生长的应力SiGe结构,通过实验研究了生长温度,组成和单独层中的弹性应变对锑偏析的影响。可以确定的是,生长条件和结构参数对Sb的偏析具有相互关系的影响:SiGe层中成分和弹性应力对Sb偏析的影响程度取决于生长温度。已经表明,考虑到所获得的Sb偏析对SiGe层的生长条件和参数的依赖性,我们先前提出的用于选择性掺杂硅结构的方法的使用使得可以形成选择性地掺杂有锑的SiGe结构。

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