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首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >Effect of mass spectrometric sampling interface on the fundamental parameters of an inductively coupled plasma as a function of its operating conditions Part I.Applied r.f.power and vacuum
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Effect of mass spectrometric sampling interface on the fundamental parameters of an inductively coupled plasma as a function of its operating conditions Part I.Applied r.f.power and vacuum

机译：质谱采样接口对电感耦合等离子体基本参数的影响与其工作条件的关系第一部分应用射频功率和真空

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摘要

The effects of a mass-spectrometer sampling interface on the fundamental parameters of an argon inductively coupled plasma were studied.Laser-scattering techniques were used to obtain radially resolved values for electron number density(n_e),electron temperature(T_e),and gas-kinetic temperature(T_g) of the ICP upstream from the sampler as a function of applied r.f.power while different sample solutions were introduced.In addition,radially resolved calcium ion and atom number densities were determined under the same conditions in order to study the effects of matrix elements upstream from the mass spectrometer interface.It was found that the interface causes changes in the fundamental parameters that are dependent on the ICP applied r.f.power and the pressure at the back of the sampling interface.Furthermore,the changes caused by matrix interferents are different in the presence and in the absence of the sampler.
机译：研究了质谱仪采样界面对氩感应耦合等离子体基本参数的影响。采用激光散射技术获得了径向分辨的电子数密度（n_e），电子温度（T_e）和气体引入不同样品溶液时，进样器上游ICP的动力学温度（T_g）与施加的rfpower的函数关系。此外，在相同条件下测定了径向解析的钙离子和原子数密度，以研究质谱仪界面上游的基质元素。发现界面引起基本参数的变化，这些参数取决于ICP施加的射频功率和采样界面背面的压力。此外，基质干扰物引起的变化是在有和没有采样器的情况下有所不同。

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