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Enhanced cathodoluminescence from nano-indentations in MgO

机译:MgO中纳米压痕增强阴极发光

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Cathodoluminescence (CL) imaging in the wavelength range of 380 to 800 nm of nano-indents in MgO crystals made with a Berkovich diamond triangular pyramid has been carried out using a scanning electron microscope. It is shown that the centres of nano-indents of estimated residual depths in the range of about 570 to 325 nm do luminesce fairly strongly and the spatial resolution of the image appears to be better than 1 μm as revealed by the structure within the CL image. Centres of larger indents of residual depths greater than about 1300 nm do not show luminescence. It is suggested that most of the CL from the indentation centres is due to F and F~+ colour centres produced by plastic flow, with emission peaks at 525 and 375 nm respectively. Furthermore, it is also suggested that the relative number density of F~+ centres increases with increasing plastic strain, which in turn increases with increasing indentation size. Therefore, beyond some critical indentation size, most of the CL from the indentation centre will be due to the F~+ centres and, as its luminescence is beyond the detection sensitivity of the CL system, the indentation centre shows an absence of CL.
机译:已经使用扫描电子显微镜在用Berkovich金刚石三角锥制成的MgO晶体中在380至800 nm纳米压痕的波长范围内进行阴极发光(CL)成像。结果表明,估计残留深度在约570至325 nm范围内的纳米压痕中心确实具有相当强的发光性,并且该图像的空间分辨率似乎优于1μm,这是由CL图像中的结构所揭示的。 。残留深度大于1300 nm的较大凹痕的中心未显示出发光。建议大多数来自压痕中心的CL是由于塑性流产生的F和F〜+色心,发射峰分别在525和375 nm处。此外,还建议F〜+中心的相对数密度随着塑性应变的增加而增加,而塑性应变的增加又随着压痕尺寸的增加而增加。因此,超出某些临界压痕尺寸,来自压痕中心的大部分CL将归因于F〜+中心,并且由于其发光超出CL系统的检测灵敏度,因此压痕中心显示不存在CL。

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