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Characterization of Ga_(1-x)Mn_xAs/(001)GaAs epilayers grown by low-temperature molecular beam epitaxy

机译:低温分子束外延生长的Ga_(1-x)Mn_xAs /(001)GaAs外延层的表征

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摘要

Ga_(1-x)Mn_xAs/(001) GaAs (x = 2.2, 5.6, 9 at. percent) epitaxial layers grown by low-temperature MBE, exhibiting anisotropic magnetic properties, have been characterized using a range of transmission electron microscopy techniques and secondary-ion mass spectrometry. Banded contrast features on inclined {111}_B planes are observed for the [110] projection of micron-thick samples with high Mn content, and are attributed to a compositional fluctuation in the interstitial Mn content. Precipitates attributed to tetragonally distorted MnAs are associated with the onset of stacking-fault formation during layer growth. The formation of an Mn-O layer at the surface of the samples is also observed, attributed to post-growth oxidation of an Mn surfactant layer.
机译:已通过一系列透射电子显微镜技术对通过低温MBE生长的Ga_(1-x)Mn_xAs /(001)GaAs(x = 2.2、5.6、9 at。%)外延层表现出各向异性的磁性进行了表征。二次离子质谱对于具有高Mn含量的微米厚样品的[110]投影,在倾斜的{111} _B平面上观察到带状对比度特征,这归因于间隙Mn含量的成分波动。 MnAs呈四边形变形的沉淀与层生长期间堆积断层形成的开始有关。还观察到在样品表面上形成了Mn-O层,这归因于Mn表面活性剂层的后生长氧化。

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