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首页> 外文期刊>Philosophical Magazine Letters >A triple-node intrinsic stacking faultanotwin/extrinsic stacking fault in a small GaAs island grown on a Si (001) substrate
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A triple-node intrinsic stacking faultanotwin/extrinsic stacking fault in a small GaAs island grown on a Si (001) substrate

机译:在Si(001)衬底上生长的小GaAs岛中的三节点本征堆叠断层/纳特温/本征堆叠断层

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摘要

The defect content of small GaAs islands grown by molecular-beam epitaxy on a Si (001) substrate is investigated using high-resolution electron microscopy. The smallest non-defect-free islands contain stair-rod dislocations (SRDs) with Burgers vectors 1/6[110] or 1/3 [110] linked to intrinsic stacking faults (ISFs) or extrinsic stacking faults (ESFs). When two SRDs are simutaneously present, they can interact to form an ultrathin twin in GaAs so that a triple-line ISFanotwin/ESF can form, along which an edge 1/3[001] dislocation is present. A mechanism is proposed to interpret the triple node, based on the formation of planar defects produced by emission from the free surface.
机译:使用高分辨率电子显微镜研究了通过分子束外延在Si(001)衬底上生长的小GaAs岛的缺陷含量。最小的无缺陷岛包含带有与固有堆垛层错(ISF)或外部堆垛层错(ESF)相关的Burgers矢量1/6 [110]或1/3 [110]的楼梯杆错位(SRD)。当同时存在两个SRD时,它们可以相互作用形成GaAs中的超薄孪晶,从而可以形成三线ISF / nanotwin / ESF,沿其存在1/3 [001]边缘。提出了一种机制的解释,该解释是基于自由表面发射产生的平面缺陷的形成来解释三重节点。

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