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Assessment of convergence effects in weak-beam transmission electron microscopy in partial spacing measurements in Ni_3Al

机译：Ni_3Al中部分间距测量中弱束透射电子显微镜的会聚效应评估

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ABSTRACT Recently, Schaublin, Meng and Stobbs have taken a new approach to the weak-beam technique for the measurement of dissociated dislocation spacings in the evaluation of stacking fault energies. They have demonstrated, through image simulations, both the importance and usefulness of using convergence values above those traditionally considered to be appropriate. An experimental exploration of the new convergent weak-beam technique is presented here in the ) ( case of Ni Al for a g 4g condition at 200 kV. It appears that the influence of the 3 convergence in weak-beam transmission electron microscopy (WB TEM) as depicted by Schaublin et al. is confirmed experimentally for the conditions used here. Owing to the depth oscillations being smeared out, the accuracy in partial dislocation spacing measurement is increased when the beam convergence is increased. A further study of the influence of the convergence in relation to the WB TEM condition is presented here and shows that the higher the deviation parameter, the lower the variation in average apparent spacing with convergence.
机译：摘要最近，Schaublin，Meng和Stobbs在薄层技术中采用了一种新方法来测量解离位错间距，以评估堆垛层错能量。他们通过图像模拟证明了使用收敛值高于传统上认为合适的收敛值的重要性和有效性。在（200 kV的ag 4g条件下，Ni Al的情况下）提出了一种新的会聚弱束技术的实验探索。似乎在弱束透射电子显微镜（WB TEM）中3会聚的影响如Schaublin等人所描述的，在这里使用的条件已通过实验证实，由于深层振荡被抹去，当束会聚增加时，部分位错间距测量的精度会提高。这里给出了与WB TEM条件相关的信息，表明偏差参数越高，平均视在间距随收敛的变化就越小。

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