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首页> 外文期刊>Philosophical magazine, B. Physics of condensed matter, electronic, optical, and magnetic properties >Imaging point defects using a transmission electron microscope with controllable spherical aberration
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Imaging point defects using a transmission electron microscope with controllable spherical aberration

机译:使用具有可控球差的透射电子显微镜成像点缺陷

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Computer simulations are utilized to show how to use a transmission electron microscope which has an objective lens with an adjustable coefficient of spherical aberration to determine the three spatial coordinates of a single heavy atom embedded in a crystal. This information can be obtained by forming an image with only those electrons that have been scattered through a large angle by the crystal. By using a high-angle annular dark-field aperture the atoms can be considered as independent scatterers, in contrast with imaging with low-angle coherent scattering. In addition, by reducing the aberration coefficients of the lens, the effective outer radius of the aperture can be made large, thereby leading to a small depth of focus. Calculations show that this form of imaging produces detectable contrast with currently available aberration correctors, sources and detectors. [References: 24]
机译:利用计算机模拟来显示如何使用具有物镜的透射电子显微镜,该物镜具有可调节的球差系数来确定嵌入晶体中的单个重原子的三个空间坐标。该信息可以通过仅使用那些已被晶体以大角度散射的电子形成图像来获得。通过使用高角度环形暗场孔径,与具有低角度相干散射的成像相比,可以将原子视为独立的散射体。另外,通过减小透镜的像差系数,可以使光圈的有效外径变大,从而导致较小的聚焦深度。计算表明,这种成像形式与当前可用的像差校正器,源和检测器产生可检测的对比度。 [参考:24]

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