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首页> 外文期刊>Physica Scripta: An International Journal for Experimental and Theoretical Physics >Optical and structural properties of cadmium telluride films grown by glancing angle deposition
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Optical and structural properties of cadmium telluride films grown by glancing angle deposition

机译：掠角沉积生长的碲化镉薄膜的光学和结构性质

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摘要

Cadmium telluride films were grown by the glancing angle deposition (GLAD) technique. The samples were prepared under different incident deposition flux angles (α = 0°, 20° and 70°measured from the normal to the substrate surface). During deposition, the substrate temperature was maintained at room temperature. The structural study was performed using an x-ray diffraction diffractometer. The samples were found to be poly-crystalline with cubic structure for those deposited at α = 0° and 20° and hexagonal structure for the one deposited at 70°. The images of samples obtained by the field emission scanning electron microscopy technique showed that the GLAD method could produce a columnar layer tilted toward the incident deposition flux. The optical properties study by the UV-Vis spectroscopy technique showed that the use of this growth technique affected the optical properties of the films. A higher absorption coefficient in the visible and near-IR spectral range was observed for the sample deposited at α = 70°. This is an important result from the photovoltaic applications point of view where absorber materials with large absorption coefficients are needed. Also, it seems that the sample with a high incident deposition flux angle has the capability of making an n-CdTe/p-CdTe homo-junction.
机译：通过掠射角沉积（GLAD）技术生长碲化镉薄膜。样品是在不同的入射沉积通量角（从法线到基材表面测量的α= 0°，20°和70°）下制备的。在沉积期间，衬底温度保持在室温。使用X射线衍射衍射仪进行结构研究。对于在α= 0°和20°下沉积的样品，发现其样品具有立方结构的多晶体，而在70°下沉积的样品则为六方结构的晶体。通过场发射扫描电子显微镜技术获得的样品图像显示，GLAD方法可以产生一个向入射沉积通量倾斜的柱状层。通过UV-Vis光谱技术的光学性质研究表明，这种生长技术的使用影响了膜的光学性质。在α= 70°处沉积的样品在可见光和近红外光谱范围内观察到更高的吸收系数。从光伏应用的角度来看，这是重要的结果，在光伏应用中，需要具有大吸收系数的吸收材料。而且，似乎具有高入射沉积通量角的样品具有制造n-CdTe / p-CdTe同质结的能力。

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