Electrical properties of polycrystalline CaB_6 under high pressure and low temperature

Yan Li; Jie Yang; Xiaoyan Cui; Tingjing Hu; Cailong Liu; Yongjun Tian; Hongwu Liu; Yonghao Han; Chunxiao Gao

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Electrical properties of polycrystalline CaB_6 under high pressure and low temperature

机译：高压和低温下多晶CaB_6的电性能

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Carrier behavior of CaB_6 powders was investigated by using in situHall effectmeasurement under high pressure and resistivity property was detected under low temperature with microcircuit fabricated on diamond anvil cell. Carrier behavior was analyzed by carrier concentration and Hall coefficient. The variation of defects in the grain boundary region lead the carrier concentration and the Hall coefficient in the decompression process are much lower than that in the compression process. The resistivity depended temperature at various pressures indicated that CaB_6 has a typical metallic behavior under high pressure.

机译：通过在高压下进行原位霍尔效应测量，研究了CaB_6粉末的载流子行为，并在金刚石砧座上制作了微电路，在低温下检测了电阻率特性。通过载流子浓度和霍尔系数分析载流子行为。晶界区域中缺陷的变化导致在减压过程中的载流子浓度和霍尔系数远低于在压缩过程中的载流子浓度和霍尔系数。在各种压力下电阻率取决于温度，表明CaB_6在高压下具有典型的金属性能。

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《Physica status solidi, B. Basic research》 |2011年第5期|共4页
作者
Yan Li; Jie Yang; Xiaoyan Cui; Tingjing Hu; Cailong Liu; Yongjun Tian; Hongwu Liu; Yonghao Han; Chunxiao Gao;
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正文语种 eng
中图分类固体物理学;
关键词
carrier concentration; diamond anvil cell; in situ Hall effect;

机译：载流子浓度;金刚石砧座;原位霍尔效应;

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Electrical properties of polycrystalline CaB_6 under high pressure and low temperature

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