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首页> 外文期刊>Physica status solidi, B. Basic research >The morphology of silicon nanowire samples: A Raman study
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The morphology of silicon nanowire samples: A Raman study

机译:硅纳米线样品的形态:拉曼研究

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Raman spectra of silicon nanowires (SiNWs) are studied as a function of laser excitation power and temperature. With increase in temperature and power a red-shift of the SiNWs first order optical mode is observed. At ambient conditions, the Raman shift shows a saturated behavior beyond a critical power. Similar measurements, under vacuum, rule out effects due to thermal convection as a reason for the observed saturation. We assign this to a change in sample morphology. A simulation of the SiNW peak position reveals that its temperature behavior can be explained by a four-phonon anharmonic process. SEM image of a typical SiNWs sample. The SiNW are 15 nm in diameter and up to a few microns long. The sample is a large bundle of SiNWs (up to 50mm thick) with strong porosity.
机译:研究了硅纳米线(SiNWs)的拉曼光谱与激光激发功率和温度的关系。随着温度和功率的增加,观察到SiNW的一阶光学模式发生红移。在环境条件下,拉曼位移显示出超出临界功率的饱和行为。在真空下进行类似的测量,可以排除由于热对流引起的影响,这是观察到饱和的原因。我们将此归因于样品形态的变化。 SiNW峰位置的模拟表明,其温度行为可以通过四声子非谐过程来解释。典型的SiNWs样品的SEM图像。 SiNW的直径为15 nm,最长可达几微米。样品是一大束具有高孔隙率的SiNW(厚达50mm)。

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