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首页> 外文期刊>Physica status solidi, B. Basic research >Sulfurization of near-stoichiometric CuIn precursor and the influence of low-temperature slopes on morphology and structural quality
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Sulfurization of near-stoichiometric CuIn precursor and the influence of low-temperature slopes on morphology and structural quality

机译:接近化学计量比的CuIn前驱物的硫化和低温斜率对形态和结构质量的影响

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摘要

Polycrystalline CuInS _2 (CIS) films are prepared by sulfurization of CuIn metallic precursors with Cu/In=1.2 on Mo substrates. Variation of the rapid thermal processing (RTP) parameters adjusted to the low copper surplus yielded near stoichiometric CIS films with considerably less CuS _x precipitation at the surface. A start temperature and low temperature slopes were introduced to guarantee crystal quality and large grain size. XPS/UPS, X-ray diffraction measurement, and scanning electron microscopy data show the distinct properties of the chalcopyrite phase and its morphological structure in comparison to the standard sulfurization process. A considerable improvement has been achieved by variation of the temperature profiles. The proposed process modules obtain near stoichiometric CIS films for industrial solar cell production
机译:通过在Mo基片上硫化Cu / In = 1.2的CuIn金属前驱物制备多晶CuInS _2(CIS)薄膜。调整为低铜剩余量的快速热处理(RTP)参数的变化产生了接近化学计量的CIS膜,表面的CuS _x沉淀明显减少。引入起始温度和低温斜率以确保晶体质量和大晶粒尺寸。 XPS / UPS,X射线衍射测量和扫描电子显微镜数据显示,与标准硫化工艺相比,黄铜矿相具有明显的特性及其形态结构。通过改变温度曲线已经实现了相当大的改进。拟议的工艺模块获得接近化学计量的CIS膜,用于工业太阳能电池生产

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