Thin film structure of tin(II) iodide

Kostko VS.; Kostko OV.; Makovetskii GI.; Yanushkevich KI.

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Thin film structure of tin(II) iodide

机译：碘化锡（II）的薄膜结构

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Thin films of tin(II) iodide were prepared and characterized. The lattice structure of thin films determined by X-ray diffraction is different from that of bulk SnI2. This change of lattice is explained by a polymorphous transition of monoclinic alpha-SnI2 to hexagonal beta-SnI2. The unit cell parameters of beta-SnI2 are a = (4.506 +/- 0.014) Angstrom, c = (6.946 +/- 0.011) Angstrom. Thin films of beta-SnI2 have predominant [001] orientation. [References: 10]

机译：制备并表征了碘化锡（II）薄膜。通过X射线衍射确定的薄膜的晶格结构不同于块状SnI 2的晶格结构。晶格的这种变化是由单斜晶α-SnI2向六方β-SnI2的多态转变所解释的。 β-SnI2的晶胞参数是a =（4.506 +/- 0.014）埃，c =（6.946 +/- 0.011）埃。 β-SnI2薄膜的取向主要为[001]。 [参考：10]

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《Physica status solidi, B. Basic research》 |2002年第3期|共4页
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Kostko VS.; Kostko OV.; Makovetskii GI.; Yanushkevich KI.;
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1. Thin film structure of tin(II) iodide [J] . Kostko VS., Kostko OV., Makovetskii GI., Physica status solidi, B. Basic research . 2002,第3期

机译：碘化锡（II）的薄膜结构
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Thin film structure of tin(II) iodide

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