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首页> 外文期刊>Physica status solidi, B. Basic research >The effective susceptibility exponent in transverse Ising thin films
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The effective susceptibility exponent in transverse Ising thin films

机译:横向伊辛薄膜的有效磁化指数

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By the use of both the standard mean field theory and the effective field theory with correlations the phase transition of the transverse Ising thin films is investigated with special emphasis to the behavior of the susceptibility chi(T) outside the critical regime. The exchange interaction and transverse field at the surfaces of the thin film take values different from those in the bulk. Various non-monotonic temperature dependences of the effective exponent gamma(T) introduced by Kouvel and Fisher are found, depending on the ratios of these properties between the surfaces and the bulk as well as the value of film thickness L. They are clearly different from the behavior in the bulk. [References: 24]
机译:通过使用标准平均场论和有效场论及其相关性,研究了横向伊辛薄膜的相变,并特别强调了临界状态外的磁化率chi(T)的行为。薄膜表面的交换相互作用和横向场的值不同于本体中的值。由Kouvel和Fisher引入的有效指数gamma(T)的各种非单调温度相关性,取决于表面和体积之间的这些特性之比以及膜厚度L的值。它们明显不同于大量的行为。 [参考:24]

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