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首页> 外文期刊>Physica, B. Condensed Matter >Preparation and transport properties of high-quality thin films of the heavy-fermion system CeCu_6
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Preparation and transport properties of high-quality thin films of the heavy-fermion system CeCu_6

机译:重金属费米系统CeCu_6的高质量薄膜的制备和传输性能

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Thin films of the heavy-fermion compound CeCu_6 were prepared by co-sputtering from two high-purity targets of Ce and Cu. We used electron probe microanalysis and Rutherford backscattering to determine composition and thickness, Auger electron spectroscopy for depth profile analysis and X-ray diffraction to check crystallinity. The films were found to be of high quality. Resistivity and magnetoresistance measurements as a function of temperature (0.03-300 K) on films of thicknesses ca. 200 em mimic the properties of bulk CeCu_6. Based upon these transport measurements we have evidence for the formation of a strongly correlated electron state in our films.
机译:通过从两个高纯度的Ce和Cu靶上共溅射制备重铁化合物CeCu_6的薄膜。我们使用电子探针微分析和卢瑟福反向散射来确定组成和厚度,使用俄歇电子能谱进行深度分布分析,并使用X射线衍射检查结晶度。发现这些膜是高质量的。在厚度为ca的薄膜上,电阻率和磁阻测量值是温度(0.03-300 K)的函数。 200 em模拟块状CeCu_6的特性。基于这些传输测量,我们有证据表明在我们的薄膜中形成了高度相关的电子态。

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