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首页> 外文期刊>Physica, B. Condensed Matter >Measurement of the magnetism of a single atomic plane with X-ray diffraction
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Measurement of the magnetism of a single atomic plane with X-ray diffraction

机译：用X射线衍射测量单个原子平面的磁性

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Surface X-ray diffraction measurements have been done in cobalt ultrathin films (2-12 atomic layers) grown on Pt(111). Cobalt grows, at room temperature, in an imperfect layer by layer mode with its own lateral lattice spacing. The packing of the atomic planes is predominantly FCC but it changes to HCP upon annealing to similar to 450 K. Resonant magnetic diffraction experiments in the L-III absorption edge of Pt allow to determine the magnetism of the Pt atoms at the interface. By measuring magnetic crystal truncation rods, it has been found that only the Pt atoms in contact with the Co overlayer are magnetised (similar to 0.2 mu(B),) being the magnetisation of the second Pt layer about ten times smaller. The induced magnetic moment of Pt interface has been found to vary rather linearly with the thickness of the Co film, similarly to the magnetisation of the overlayer. The transformation FCC to HCP of the cobalt stacking results in a similar to 25% enhancement of the magnetisation at the interface. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 11]
机译：表面X射线衍射测量已在Pt（111）上生长的钴超薄膜（2-12原子层）中完成。钴在室温下以其自身的横向晶格间距以不完美的逐层模式生长。原子平面的堆积主要是FCC，但退火后变为类似于450 K的HCP。在Pt的L-III吸收边缘进行的共振磁衍射实验可以确定界面处Pt原子的磁性。通过测量磁性晶体截断棒，已发现仅与Co覆盖层接触的Pt原子被磁化（类似于0.2μ（B）），是第二个Pt层的磁化约小十倍。已经发现，Pt界面的感应磁矩与Co膜的厚度相当线性地变化，类似于覆盖层的磁化强度。钴堆积从FCC到HCP的转变导致界面处的磁化强度提高了近25％。 （C）1998 Elsevier Science B.V.保留所有权利。 [参考：11]

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