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首页> 外文期刊>Physica, C. Superconductivity and its applications >Growth and characterization of superconducting films Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9 on CeO2-buffered single crystal YSZ
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Growth and characterization of superconducting films Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9 on CeO2-buffered single crystal YSZ

机译:CeO2缓冲单晶YSZ上Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9的生长和表征

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摘要

Crystalline CeO2 as a buffer layer on single crystal yttrium stabilized zirconia (YSZ) has been deposited in situ at 600-650 degrees C by laser ablation. Following the deposition of CeO2, Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9 ((Tl,Bi-1223) amorphous films were deposited on the CeO2-buffered YSZ substrate at room temperature. The deposited amorphous films were then wrapped together with an unfired Tl0.95Bi0.22Sr1.6Ba0.4Ca2Cu3O9 pellet in silver foil. The whole package was finally annealed ex situ in a tube furnace at 790-810 degrees C with flowing argon to crystallize the films. X-ray diffraction (XRD) shows that the annealed films consist of mainly c-axis aligned (Tl,Bi)-1223 phase with a small amount of (Tl,Bi)-1212 phase. The full width at half maximum (FWHM) values of XRD omega-scans at (007) of (Tl,Bi)-1223 phase and (005) of (Tl,Bi)-1212 phase are 0.44 degrees and 0.48 degrees respectively. XRD phi-scans on (102) of both (Tl,Bi)-1223 and (Tl,Bi)-1212 phases show an excellent in-plane alignment with FWHM values of 0.44 degrees and 0.54 degrees, respectively. Four-probe transport measurements show superconducting transition temperatures (T-c's) of 105-109 K depending on the annealing conditions. At 77 K and zero external magnetic field, transport critical current density (J(c)) is in the range of (0.6-1) x 10(6) A/cm(2) for samples with thickness of 1.5-1.8 mu m. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 11]
机译:通过激光烧蚀在600-650摄氏度下原位沉积了单晶钇稳定氧化锆(YSZ)上作为缓冲层的CeO2晶体。沉积CeO2之后,在室温下将Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9((Tl,Bi-1223)非晶膜沉积在CeO2缓冲的YSZ衬底上,然后将其与未烧制的Tl0缠绕在一起。将银箔中的0.95Bi0.22Sr1.6Ba0.4Ca2Cu3O9球粒最终在790-810摄氏度的管式炉中用流动的氩气进行异位退火,使薄膜结晶,X射线衍射(XRD)显示退火后薄膜主要由c轴对齐(Tl,Bi)-1223相和少量(Tl,Bi)-1212相组成,XRDΩ扫描在(007)处的半峰全宽(FWHM)值为(Tl,Bi)-1223相和(Tl,Bi)-1212相的(005)分别为0.44度和0.48度。对(Tl,Bi)-1223和(Tl, Bi)-1212相显示出优异的面内对准,FWHM值分别为0.44度和0.54度。四探针传输测量显示超导转变温度(T- c的取值范围为105-109 K,具体取决于退火条件。对于厚度为1.5-1.8μm的样品,在77 K和零外部磁场下,传输临界电流密度(J(c))在(0.6-1)x 10(6)A / cm(2)的范围内。 (C)1998 Elsevier Science B.V.保留所有权利。 [参考:11]

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