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首页> 外文期刊>Physica, C. Superconductivity and its applications >ANALYTICAL TEM INVESTIGATIONS OF YBA2CU3O7-X WITH Y2BACUO5 INCLUSIONS
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ANALYTICAL TEM INVESTIGATIONS OF YBA2CU3O7-X WITH Y2BACUO5 INCLUSIONS

机译：包含Y2BACUO5的YBA2CU3O7-X的分析TEM研究

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摘要

Melt textured Y-Ba-Cu-O material with inclusions of the expected composition of Y2BaCuO5 was characterized by magnetic measurements (critical current density: 4 X 10(4) A cm(-2) at 77 K, 0 T) and its microstructure was investigated by a combination of transmission electron microscopic (TEM) imaging, electron diffraction and energy dispersive X-ray spectroscopy (EDXS) in the same microscope with an acceleration voltage of 200 kV. With regard to the investigated inclusions and their vicinities it was impossible to find a systematical arrangement of the crystallographic orientations of matrix and inclusion. On the other hand there are indications that the disturbed transition width depends on the crystallographic orientations of matrix and inclusion referring to the interface between them. Therefore a wide spread of transition widths up to some nanometers is probable. The smallest interface width observed in a micrograph was less than 1 nm. [References: 10]
机译：通过磁测量（临界电流密度：在77 K，0 T时的临界电流密度：4 X 10（4）A cm（-2））表征了具有Y2BaCuO5预期成分的熔融织构Y-Ba-Cu-O材料及其微观结构通过在同一显微镜下以200 kV的加速电压通过透射电子显微镜（TEM）成像，电子衍射和能量色散X射线能谱（EDXS）的组合进行研究。关于所研究的夹杂物及其附近，不可能找到基质和夹杂物的晶体学取向的系统排列。另一方面，有迹象表明，受干扰的跃迁宽度取决于基体和夹杂物的晶体学取向，是指它们之间的界面。因此，过渡宽度可能会扩展到几纳米。在显微照片中观察到的最小界面宽度小于1 nm。 [参考：10]

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