首页> 外文期刊>Physica, C. Superconductivity and its applications >SURFACE TOPOGRAPHY AND BULK STRUCTURE OF BI2SR2CACU2O8+DELTA FILMS OBSERVED BY SCANNING TUNNELING MICROSCOPY AND HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY
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SURFACE TOPOGRAPHY AND BULK STRUCTURE OF BI2SR2CACU2O8+DELTA FILMS OBSERVED BY SCANNING TUNNELING MICROSCOPY AND HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY

机译:扫描隧道显微镜和高分辨率透射电子显微镜观察到的BI2SR2CACU2O8 +δ膜的表面层析和块状结构

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The surface topography of thin Bi2Sr2CaCu2O8+delta films prepared on SrTiO3 (001) substrates by DC sputtering and layer-by-layer molecular-beam epitaxy (MBE) growth was investigated by scanning tunneling microscopy. The films were smooth but displayed a number of fine-scaled surface features, among them steps of unexpected height and domains of the incommensurate lattice modulation. The modulation period varied in dependence on the oxygen content of the films. High-resolution transmission electron microscopy investigations of cross sections were undertaken in order to identify the origin of the surface features and to correlate them with the bulk structure of the films. The surface steps on the DC sputtered films were shown to originate from the interplay of the island growth mode with nanometer-scale fluctuations of the chemical composition. The domains of the incommensurate modulation and the variation of its period were also found in the bulk of the films, as well as misfit dislocations near the Bi2Sr2CaCu2O8+delta/SrTiO3 interface. [References: 27]
机译:通过扫描隧道显微镜研究了通过直流溅射和逐层分子束外延(MBE)生长在SrTiO3(001)衬底上制备的Bi2Sr2CaCu2O8 +δ薄膜的表面形貌。膜很光滑,但显示出许多细微的表面特征,其中包括意想不到的高度和不相称的晶格调制区域。调制周期根据薄膜的氧含量而变化。为了确定表面特征的起源并使它们与薄膜的整体结构相关,对横截面进行了高分辨率透射电子显微镜研究。直流溅射膜上的表面台阶被证明源自岛生长模式与化学成分的纳米级波动的相互作用。在大量的薄膜中以及在Bi2Sr2CaCu2O8 +δ/ SrTiO3界面附近的失配位错中也发现了不相称的调制域及其周期变化。 [参考:27]

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