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首页> 外文期刊>Physica, C. Superconductivity and its applications >Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements
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Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements

机译：通过红外反射率和透射率测量光学测定YBa2Cu3O6 + x薄膜中的氧含量

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Recent studies of the optical properties of YBa2Cu3O6+x (YBCO) single crystals by several authors have shown that the optical conductivity in the infrared spectral region is a sensitive function of the oxygen content of the samples. Infrared spectroscopy thus offers a possibility for oxygen concentration analysis and is an alternative to other methods such as (i) the X-ray determination of the length of the c-axis and (ii) spectroscopic ellipsometry at an electronic transition band centered around 4.1 eV whose strength decreases with increasing oxygen content. We explore the applicability of the IR optical method for the case of YBCO thin films of about 300 nm thickness which are epitaxially grown on SrTiO3 substrates. We perform normal-incidence transmittance and reflectance measurements between 2000 and 3000 mn to determine the refractive index and the absorption coefficient of the films. Due to the large penetration depth of the IR light it is essential to pay regard to the interferometric aspects of light propagation in the film and to take care of ambiguities in the mathematical inversion. The latter problem is solved by using the asymmetry of the reflectance measured on the two different sides of the sample. It is shown that the accuracy of the results depends on the quality of the films and on the accuracy with which their thickness can be determined by an independent measurement. Despite these difficulties the method provides a simple means for monitoring the oxygen content of YBCO films in the whole doping regime (0 less than or equal to x less than or equal to 1). (C) 2001 Elsevier Science B.V. All rights reserved. [References: 22]
机译：几位作者对YBa2Cu3O6 + x（YBCO）单晶的光学性质的最新研究表明，红外光谱区的光学电导率是样品中氧含量的敏感函数。因此，红外光谱法为进行氧浓度分析提供了可能性，并且是其他方法的替代方法，例如（i）对c轴长度进行X射线测定，以及（ii）以4.1 eV为中心的电子跃迁谱带的椭圆偏振光谱法其强度随氧含量的增加而降低。我们探索了红外光学方法在SrTiO3衬底上外延生长的约300 nm厚度的YBCO薄膜情况下的适用性。我们在2000到3000 mn之间进行法线入射透射率和反射率测量，以确定薄膜的折射率和吸收系数。由于红外光的穿透深度大，因此必须考虑到膜中光传播的干涉测量方面，并要注意数学求逆中的歧义。通过使用在样品的两个不同侧面上测得的反射率的不对称性解决了后一个问题。结果表明，结果的准确性取决于薄膜的质量以及取决于通过独立测量确定其厚度的准确性。尽管存在这些困难，该方法仍提供了一种在整个掺杂方案中监控YBCO薄膜中氧含量的简单方法（0小于或等于x小于或等于1）。 （C）2001 Elsevier Science B.V.保留所有权利。 [参考：22]

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