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首页> 外文期刊>Physica, C. Superconductivity and its applications >Self-field reduces critical current density in thick YBCO layers
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Self-field reduces critical current density in thick YBCO layers

机译：自场降低了厚YBCO层中的临界电流密度

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摘要

The engineering current density in YBCO coated conductor applications can be improved in two ways. Either the critical current density should be improved or the superconducting films made thicker. Unfortunately, it has often been observed that the average critical current density decreases when the thickness of films increases. Suggested reasons for this behaviour include e.g. two dimensional pinning properties, microcracks and imperfect crystallographic alignment. However, it is often forgotten that the self-field effect unavoidably reduces the critical current density when the thickness of YBCO films increases and thereby total current rises. In this paper, the influence of self-field on the average critical current density is studied computationally as a function of film thickness. The situation is also scrutinized at different external magnetic fields in order to find ways to distinguish self-field effects from problems related to the manufacturing process. For this purpose, critical current measurements in external field perpendicular to the film surface are proposed. (c) 2006 Elsevier B.V. All rights reserved.
机译：YBCO涂层导体应用中的工程电流密度可以通过两种方式提高。要么应提高临界电流密度，要么使超导膜更厚。不幸的是，经常观察到，当膜厚度增加时，平均临界电流密度降低。这种行为的建议原因包括二维钉扎特性，微裂纹和不完善的晶体学排列。然而，常常被忘记的是，当YBCO膜的厚度增加从而总电流增加时，自电场效应不可避免地降低了临界电流密度。在本文中，通过计算研究了自电场对平均临界电流密度的影响，该影响是膜厚度的函数。还要在不同的外部磁场下仔细检查这种情况，以便找到将自磁场效应与制造过程相关的问题区分开的方法。为此，提出了在垂直于膜表面的外部场中的临界电流测量。 （c）2006 Elsevier B.V.保留所有权利。

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