Molecular Resolution of Thin, Highly Oriented Poly(Tetrafluoroethylene) Filmswith the Atomic Force Microscope. (Reannouncement with New Availability Information)

著录项

• 作者

  Hansma, H.; Motamedi, F.; Smith, P.; Hansma, P.; Wittman, J. C.;

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• 作者单位

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• 年度 1992
• 页码
• 总页数 6
• 原文格式 PDF
• 正文语种 eng
• 中图分类 工业技术;
• 关键词

  Microscopes; Resolution; Surface roughness; Tetrafluoroethylene resins; Vaporphases; Thin films; Molecular structure; Polymers; Deposition; Films; Images; Layers; Macromolecules; Materials; Micrometers; Phase; Structures; Substrates; Thickness; Reprints;

  机译：显微镜;分辨率;表面粗糙度;四氟乙烯树脂; Vaporphases;薄膜;分子结构;聚合物;沉积;薄膜;图像;层;大分子;材料;千分尺;相;结构;基材;厚度;重印;