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首页> 美国政府科技报告 >Computer-Aided Design for Built-In-Test (CADBIT)-BIT (Built-In-Test) Library. Volume 2.
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Computer-Aided Design for Built-In-Test (CADBIT)-BIT (Built-In-Test) Library. Volume 2.

机译：内置测试（CaDBIT）-BIT（内置测试）库的计算机辅助设计。第2卷。

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CAD-BIT is a development program to specify the implementation of an automated procedure to integrate Built-In-Test (BIT) into the design of printed circuit boards on computer-aided design workstations. When fully developed, the CAD-BIT software will be capable of operating on generic workstations meeting various standards. These standards include those for operating system (UNIX), programming language (C), and graphical data interchange Initial Graphics Exchange Specification (IGES). This volume contains a description of the BIT data base library elements and BIT library elements for the following BIT techniques: On-board ROM; Microprocessor BIT; Microdiagnostics; On-board integration of VLSI Chips BIT (OBIVCB); Built-in logic block observer (BILBO); Error detection and correction codes; Scan; Digital wraparound; Pseudo random pattern generator with multiple input shift register (PRPG/MISR); Comparator; Voltage summing; Redundancy; and Analog wraparound. The data in Volume II will be used to encode CAD-BIT's BIT technique data base during the implementation phase. In addition, it illustrates the required data for adding new BIT techniques. It also provides useful data to the future circuit designer/CAD-BIT user on the BIT techniques, their implementation, and the default circuit components. (edc)

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