• 主题
高级搜索  >
历史搜索 清空历史
首页> 美国政府科技报告 >Novel Multi-Aperture Device for Surface Roughness Measurement
【24h】

Novel Multi-Aperture Device for Surface Roughness Measurement

机译：用于表面粗糙度测量的新型多孔径器件

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

The objective of this research program is to develop a novel multi- aperture device for the surface roughness measurement. The successful fabrication of this novel device can provide the U.S. Army a handy, in situ, cost-effective. real-time tool for the precise measurement of work piece surface roughness. We have accomplished all the proposed research tasks. Specifically, (1) design and fabricate a novel multiple aperture surface roughness measurement prototype. (2) The performance of the prototype was carefully evaluated. In particular, the depth resolution as a function of the focal length of the micro lens was analyzed. It was found that the depth resolution as high as 0.05 micrometer could be achieved. (3) Combine the micro tube structure with x-direct transversal scanning. Therefore, much more data points can be obtained. In addition, not only the surface roughness but also the surface profile information can be detected. A patent on this technique was filed. Hopefully, an useful commercial product could be built based on the achievements of this research project, which will benefit both the military and civilian users.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号