首页> 美国政府科技报告 >Expert System for Design of Plastic Integrated Circuit Packages Against Latent Moisture Induced Defects. Phase II
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Expert System for Design of Plastic Integrated Circuit Packages Against Latent Moisture Induced Defects. Phase II

机译:塑料集成电路封装设计专家系统防止潜在水分引起的缺陷。第二阶段

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This program examined the feasibility of developing a model for predicting cracking of plastic integrated circuit packages. It was demonstrated that moisture induced hydro-thermal stresses during soldering operations can cause plastic package cracking or 'pop coming.' A crack propagation model was developed using fracture mechanics parameters coupled with hydrostatic stresses. Selected plastic packages were characterized using the developed model and segregated according to crack susceptibility during a solder reflow process. Model results compared favorably with laboratory testing on actual parts. Also developed was a computer based expert system that incorporates the crack prediction model.

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