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首页> 美国政府科技报告 >Single Pulse Emittance Measurement Technique for Intense Relativistic Electron Beam.
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Single Pulse Emittance Measurement Technique for Intense Relativistic Electron Beam.

机译：强相对论电子束单脉冲发射率测量技术。

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A study of emittance measurements using a slit pinhole type emittance meter is conducted using a 1 MeV, 18 ka electron beam. The beam is passed through titanium foils of varying thickness and the emittance is measured downstream. Two different types of emittance masks are used - one composed of tantalum bars with knife edges and another using cylindrical bars of elkonite. The prototype is used to measure the rms emittance and the projected phase space density of a nominal 1 MeV, 16 ka, 25 ns FWHM electron beam. Data is collected optically using an open shutter camera with polaroid film (time integrated). In addition, time resolved data is presented using a gated optical imaging ccd system on a 5 MeV IREB. This study sets a bound on the measurement accuracy to be expected when using this method of data collection and illustrates the effects of two different mask designs.

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