Reliable Application of Plastic Encapsulated Microcircuits; RAC Parts Seclection, Application and Control Series.

著录项

• 作者

  Denson, W.; Farrell, J.; Nicholls, D.;

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• 作者单位

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• 年度 1996
• 页码 1-164
• 总页数 164
• 原文格式 PDF
• 正文语种 eng
• 中图分类 工业技术;
• 关键词

  Microcircuits; Stresses; Mathematical models; High temperature; Semiconductor devices; Reliability; Military applications; Encapsulation; Plastics; Failure(Electronics); Packaged circuits; Autoclaves; Pem(Plastic encapsulated microcircuits); Reliable application; 85 deg c/85% rh; Rac(Reliability analysis center); Hast(Highly accelerated stress test);

  机译：微电路;应力;数学模型;高温;半导体器件;可靠性;军事应用;封装;塑料;失效（电子）;封装电路;高压灭菌器; pem（塑料封装微电路）;可靠应用; 85℃/ 85％rh; Rac（可靠性分析中心）; Hast（高加速度压力测试）;