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AES (Auger Electron Spectroscopy) and EELS (Electron Energy Loss Spectroscopy) Analysis of TlBaCaCuO(sub X) Thin Films at 300 K and at 100 K

机译：在300 K和100 K下的TlBaCaCuO（sub X）薄膜的aEs（俄歇电子能谱）和EELs（电子能量损失光谱）分析

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Auger electron spectroscopy line-shape analysis of the Tl(NOO), Ba(MNN), Ca(LMM), Cu(LMM) and O(KLL) peaks has been performed in conjunction with electron energy loss spectroscopy (EELS) on magnetron sputter deposited TlBaCaCuO/sub x/ thin films exhibiting a superconducting onset at 110K with zero resistance at 96K. AES and EELS analyses were performed at 300K and at 100K. Changes in the Auger line shapes and in the EELS spectra as the temperature is lowered below the critical point are related to changes in the electronic structure of states in the valence band (VB). Bulk and surface plasmon peaks are identified in the EELS spectra along with features due to core level transitions. Electron beam and ion beam induced effects are also addressed. 13 refs., 3 figs., 1 tab. (ERA citation 14:015249)

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Nelson, A. J. ; Swartzlander, A. ; Kazmerski, L. L. ; Kang, J. H. ; Kampwirth, R. T.;
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年度 1988
页码 1-11
总页数 11
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Barium Oxides; Calcium Oxides; Copper Oxides; Thallium Oxides; Electronic Structure; Superconductivity; Thin Films; Auger Electron Spectroscopy; Electron Beams; Energy-Loss Spectroscopy; Ion Beams; Phase Transformations; Transition Temperature;

机译：氧化钡;氧化钙;氧化铜;氧化铊;电子结构;超导;薄膜;俄歇电子能谱;电子束;能量损失光谱;离子束;相变;转变温度;

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专利

1. Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces [J] . Paparazzo E., Moretto L., Brolatti M. Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology . 2002,第2期

机译：GaP和Si表面的俄歇电子能谱（AES）和电子能量损失能谱（EELS）研究
2. A comparative study of elastic recoil detection analysis (ERDA), electron energy loss spectroscopy (EELS) and X-ray photoelectron spectroscopy (XPS) for structural analysis of amorphous carbon nitride films [J] . C. Spaeth, M. Kuhn, F. Richter, Diamond and Related Materials . 1998,第11a12期

机译：弹性反冲检测分析（ERDA），电子能量损失谱（EELS）和X射线光电子能谱（XPS）用于非晶氮化碳膜结构分析的比较研究
3. Electron energy loss spectroscopy, low energy electron diffraction, and auger electron spectroscopy study of Indium overlayers on Si(111) and Si(100) surfaces [J] . Manhui Sun, Chuan Hu, R.G. Zhao, Thin Solid Films . 2005,第1a2期

机译：Si（111）和Si（100）表面上铟覆盖层的电子能量损失谱，低能电子衍射和俄歇电子能谱研究
4. Application of Auger electron spectroscopy (AES), TEM electron energy loss spectrum (EELS) in failure analysis on poly grooves issue in wafer fabrication [C] . Phong Ooi Lin, Ang Ghim Boon, Chua Kok Keng, . 2004

机译：俄歇电子能谱（AES），TEM电子能量损失谱（EELS）在晶片制造中多槽问题的失效分析中的应用
5. Characterization of the electronic and geometric structures of aluminas using X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, and low energy electron diffraction. [D] . Kao, Chi-Chang. 1988

机译：使用X射线光电子能谱，俄歇电子能谱，电子能量损失能谱和低能电子衍射来表征氧化铝的电子和几何结构。
6. High resolution ultrastructural mapping of total calcium: electron spectroscopic imaging/electron energy loss spectroscopy analysis of a physically/chemically processed nerve-muscle preparation. [O] . F Grohovaz, M Bossi, R Pezzati, 1996

机译：总钙的高分辨率超微结构图：物理/化学处理的神经肌肉制剂的电子光谱成像/电子能量损失光谱分析。
7. Study of O/Ni(100) with LEED (low-energy electron diffraction) and AES (auger electron spectroscopy) from chemisorption to oxidation [O] . Wen-Di. Wang 1990

机译：用LEED（低能量电子衍射）和AES（螺旋钻电子谱）从化学吸附到氧化的o / Ni（100）研究
8. Studies of the Initial Oxidation of Fe-Si Alloys by AES(Auger Electron Spectroscopy), XPS (Induced Photoelectron Spectroscopy), EELS(Electron Energy Loss Spectroscopy), and LEED(Low Energy Electron Diffraction) [R] . Lee, Y. P. 1988

机译：用aEs（俄歇电子能谱），Xps（诱导光电子能谱），EELs（电子能量损失谱）和LEED（低能电子衍射）研究Fe-si合金的初始氧化

AES (Auger Electron Spectroscopy) and EELS (Electron Energy Loss Spectroscopy) Analysis of TlBaCaCuO(sub X) Thin Films at 300 K and at 100 K

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