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Volume-based considerations for the metal-insulator transition of CMR oxides

机译：基于体积的CmR氧化物金属 - 绝缘体转变考虑因素

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The sensitivity of (rho) (electrical resistivity) to changes in volume which occur through: (1) applied pressure, (2) variations in temperature, and (3) phase transitions, is evaluated for some selected CMR oxides. It is argued that the changes in volume associated with phase changes are large enough to produce self pressures in the range of 0.18 to 0.45 GPa. The extreme sensitivity of the electrical resistivity to pressure indicates that these self pressures are responsible for large features in the electrical resistivity and are an important component for occurrence the metallicity below (Tc). It is suggested that this is related to a strong volume dependence of the electron phonon coupling in the CMR oxides.

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