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Minimum detection limits of RDX and TNT deposited on various surfaces as determined by ion mobility spectroscopy

机译:通过离子迁移谱确定的沉积在各种表面上的RDX和TNT的最小检测限

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An Ion Mobility Spectrometer (IMS) was used to determine the detection limits of RDX and TNT on six different substrates. The preparation of the explosive deposits on the surfaces is examined as well as effects due to the size, uniformity, method of application, and time that a deposit has been on a surface. Sampling methods are discussed along with effects of the surface topology. The transfer of explosives from a hand to a surface, and methods to reduce the detection limits are presented.

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