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Measurements of the optical properties of thin films of silver and silver oxide

机译：银和氧化银薄膜光学性能的测量

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The optical properties of silver films and their oxides are measured to better characterize such films for use as sensors for atomic oxygen. Good agreement between properties of measured pure silver films and reported optical constants is observed. Similar comparisons for silver oxide have not been possible because of a lack of reported constants, but self-consistencies and discrepancies in our measured results are described.

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作者
Peters, Palmer N.; Sisk, Robert C.; Brown, Yolanda; Gregory, John C.; Nag, Pallob K.; Christl, Ligia;
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年度 1995
页码 1-13
总页数 13
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
GAS DETECTORS; METAL FILMS; OPTICAL PROPERTIES; OXYGEN ATOMS; SILVER; SILVER OXIDES; THIN FILMS; EXPOSURE; FILM THICKNESS; OXIDATION; SURFACE REACTIONS;

机译：气体探测器;金属薄膜;光学特性;氧气原子;银;银氧化物;薄膜;曝光;电影厚度;氧化;表面反应;

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Measurements of the optical properties of thin films of silver and silver oxide

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