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Total Ionizing Dose Effects on High Resolution (12-/14-bit) Analog-to-Digital Converters

机译：高分辨率（12/14位）模数转换器的总电离剂量效应

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摘要

This paper reports total dose radiation test results for high resolution 12-/14-bit A/D converters. Small changes in internal components can cause these devices to fail their specifications at relatively low total dose levels. Degradation of signal-to-noise ratio becomes increasingly importamt for high accuracy converters. Rebound effects in the thick-oxide MOS devices causes these responses to be different at low and high dose rates, which is a major concern for space applications.

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作者
Lee, C. I.; Rax, B. G.; Johnson, A. H.;
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年度 1994
页码 1-8
总页数 8
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
ANALOG TO DIGITAL CONVERTERS; DEGRADATION; DOSAGE; FAILURE; HIGH RESOLUTION; OXIDES; SIGNAL TO NOISE RATIOS; TECHNOLOGY UTILIZATION; ratio space applications; radiation ionizing analog-to-digital converters MOS devices signal-to-noise;

机译：模拟数字转换器;降解;剂量;失败;高分辨率;氧化物;信号比噪声;技术利用;比率空间应用;辐射电离模数转换器mOs器件信噪比;

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专利

1. Total ionizing dose effects on high resolution (12-/14-bit) analog-to-digital converters [J] . Lee C.I., Rax B.G. IEEE Transactions on Nuclear Science . 1994,第6期

机译：总电离剂量对高分辨率（12位/ 14位）模数转换器的影响
2. Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter [J] . Wu X., Lu W., Wang Y., Journal of Semiconductors . 2013,第1期

机译：总电离剂量对辐射诱导的BiMOS模数转换器的影响
3. The total ionizing dose effect in 12-bit, 125 MSPS analog-to-digital converters [J] . Wu Xue, Lu Wu, Li Yudong, Journal of Semiconductors . 2014,第4期

机译：12位125 MSPS模数转换器中的总电离剂量效应
4. Total Ionizing Dose Effects In 12-bit Successive-approxmation Analog-to-digital Converters [C] . Lee, C.I., Rax, . 1993

机译：12位逐次逼近型模数转换器中的总电离剂量效应
5. Total Ionizing Dose and Dose Rate Effects on (Positive and Negative) BJT Based Bandgap References [D] . Davis, Parker 2019

机译：总电离剂量和剂量率对（正负）BJT带隙基准的影响
6. Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer [O] . Sung-Jae Chang, Dong-Seok Kim, Tae-Woo Kim, 2020

机译：使用极薄的栅极介电层综合电离剂量效应的全电离剂量效应
7. Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs [O] . Sahu Kusum, Sharma Ashok K. 1998

机译：在NASA计划的低剂量率总电离剂量（TID）测试下评估高性能转换器
8. Total Ionizing Dose Effects in 12-Bit Successive-Approximation Analog-To-Digital Converters [R] . Lee, C. I., Rax, B. G., Johnston, A. H. 1993

机译：12位逐次逼近模数转换器中的总电离剂量效应

Total Ionizing Dose Effects on High Resolution (12-/14-bit) Analog-to-Digital Converters

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