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Scanning Tunneling and Atomic Force Microscopy Studies of Organic Thin Films,Synthetic Polymers and Lignocellulosics

机译：有机薄膜，合成聚合物和木质纤维素的扫描隧道和原子力显微镜研究

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In this thesis scanning tunneling microscopy (STM) and atomic force microscopy(AFM) techniques are applied for surface characterization. A home-built STM was first used for investigating different substrate materials in order to find the most suitable ones for special STM studies. Secondly, STM was used to get new information about the surface structure of protein bacteriorhodopsin, of purple membrane in added soyaphosphatidylcholine matrix Langmuir-Bodgett film. The

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作者
Niemi, H.;
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年度 1997
页码 1-72
总页数 72
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Surface properties; Image processing; Semiconductors; Theses; Organic thin films; Synthetic polymers; Lignocellulosics;

机译：表面特性;图像处理;半导体;论文;有机薄膜;合成聚合物;木质纤维素;

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专利

1. Study of Resonant Tunneling in Au Nanoclusters on the Surface of Si02/Si Thin Films Using the Combined Scanning Tunneling Microscopy and Atomic-Force Microscopy Technique [J] . M. A. Lapshina, D. O. Filatov, D. A. Antonov, Journal of surface investigation: x-ray, synchrotron and neutron techniques . 2009,第4期

机译：结合扫描隧道显微镜和原子力显微镜技术研究SiO 2 / Si薄膜表面金纳米团簇中的共振隧穿
2. Surface Studies of Chemical-Vapor-Deposited Diamond Thin Films, Cubic Boron Nitride, and Graphite by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM) [J] . Tomohide TAKAMI, Katsunori SUZUKI, Tetsuro MINE, 東北大学科学計測研究所報告 . 2001,第1期

机译：通过反射高能电子衍射（RHEED），原子力显微镜（AFM）和扫描隧道显微镜（STM）对化学气相沉积的金刚石薄膜，立方氮化硼和石墨进行表面研究
3. Report on the Studies of the Surfaces of Chemical-Vapor-Deposited (CVD) Thin Diamond Films Conducted by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM) [J] . Tomohide TAKAMI 東北大学科学計測研究所報告 . 2001,第1期

机译：通过反射高能电子衍射（RHEED），原子力显微镜（AFM）和扫描隧道显微镜（STM）进行化学气相沉积（CVD）金刚石薄膜表面研究的报告
4. Characterisation of the surface morphology and electronic structure of YBa_2Cu_3O_(7-x) thin films by atomic force and scanning tunneling microscopies [C] . A G Fitzgerald, Y C Fan, H C Xu, Institute of Physics Electron Microscopy and Analysis Group conference . 1997

机译：YBa_2Cu_3O_（7-x）薄膜的表面形貌和电子结构的原子力和扫描隧道显微镜表征
5. Developing alternating current scanning tunneling microscopy and atomic force microscopy to measure thin film properties on the nanoscale. [D] . Szuchmacher, Amy L. 2000

机译：发展交流电扫描隧道显微镜和原子力显微镜以测量纳米级的薄膜特性。
6. Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy [O] . Hua Kang, Xiaoqin Qian, Li Guan, 2018

机译：用原子力显微镜研究聚苯乙烯薄膜的粘附力和玻璃化转变
7. Studies on Analytical Application of Scanning Tunneling Microscopy/Photo-Induced Electropolymerization of Conducting Organic Films on Metal Surfaces Studied by Laser Raman Spectroscopy [O] . Akihiko OKUMURA, Ji-Ye JIN 1995

机译：扫描隧穿显微镜/光诱导电力聚合的分析应用在激光拉曼光谱法研究的金属表面上进行有机薄膜
8. Tribology studies of organic thin films by scanning force microscopy [R] . Bar, G., Rubin, S., Parikh, A. N., 1996

机译：用扫描力显微镜研究有机薄膜的摩擦学研究

Scanning Tunneling and Atomic Force Microscopy Studies of Organic Thin Films,Synthetic Polymers and Lignocellulosics

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