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Optical characterization and thermal properties of CVD diamond films for integration with power electronics

机译:CVD金刚石薄膜的光学表征和热性能与电力电子集成

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摘要

Studies of diamond material for thermal management are reported for a nominally 1-mm thick layer grown on silicon. Thickness of the diamond is measured using spectroscopic ellipsometry. Spectra are consistently modeled using a diamond layer taking into account surface roughness and requiring an interlayer of nominally silicon carbide. The presence of the interlayer is confirmed by transmission electron microscopy. Thermal conductivity is determined based on a heater which is microfabricated followed by back etching to produce a supported diamond membrane. Micro-Raman mapping of the diamond phonon is used to estimate temperature rise under known drive conditions of the resistive heater. Consistent values are obtained for thermal conductivity based on straightforward analytical calculation using phonon shift to estimate temperature and finite element simulations which take both temperature rise and thermal stress into account.
机译:被用于热管理的金刚石材料的研究报告为在硅上生长一个名义上1mm厚的层。金刚石的厚度使用椭偏光谱法测定。谱使用金刚石层考虑到表面粗糙度,并要求名义上碳化硅的层间一致地建模。中间层的存在是通过透射电子显微镜确认。热导率是基于其微制造随后回蚀刻以产生支撑金刚石薄膜的加热器来确定。金刚石声子的显微拉曼映射用于估计所述电阻加热器的已知的驱动条件下温度上升。用于使用声子移来估计温度和有限元模拟其采取两个温度上升和热应力考虑基于简单的解析计算的导热性,获得一致的值。

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