Device for measuring an object by means of speckle interferometry and associated method

• 1. 用于用干涉测量法测量物体的装置和方法 [P] . 中国专利： CN103090786B . 2017.07.18
• 2. 用于用干涉测量法测量物体的装置和方法 [P] . 中国专利： CN103090786A . 2013-05-08
• 3. Device for measuring an object by means of speckle interferometry and associated method [P] . 德国专利： DE102016114248A1 . 2018-02-08

  机译： 通过散斑干涉测量法测量物体的装置及相关方法

• 4. A device for measuring deformations of an object according to the principle of the speckle shearing interferometry, - - [P] . 德国专利： DE4129168C2 . 1996-03-21

  机译： 一种根据斑点剪切干涉法原理测量物体变形的设备，--

• 5. Device for application of shearography-, electronic speckle pattern interferometry- or other laser based measuring systems, has filtering system installed in optical path of measuring system on path of sensor or before beam entrance [P] . 德国专利： DE102011120135A1 . 2013-06-06

  机译： 用于剪切成像，电子散斑干涉法或其他基于激光的测量系统的设备，在测量系统的光路中，在传感器路径上或在光束进入之前安装了过滤系统

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