首页> 外国专利> MEMORY CELL WITH CHARGE TRAP TRANSISTORS AND METHOD THEREOF CAPABLE OF STORING DATA BY TRAPPING OR DETRAPPING CHARGES

MEMORY CELL WITH CHARGE TRAP TRANSISTORS AND METHOD THEREOF CAPABLE OF STORING DATA BY TRAPPING OR DETRAPPING CHARGES

机译:具有电荷陷阱晶体管的存储单元及其方法,该方法能够通过捕获或释放电荷来存储数据

摘要

A memory cell includes a first charge trap transistor and a second charge trap transistor. The first charge trap transistor has a substrate, a first terminal coupled to a first bitline, a second terminal coupled to a signal line, a control terminal coupled to a wordline, and a dielectric layer formed between the substrate of the first charge trap transistor and the control terminal of the first charge trap transistor. The second charge trap transistor has a substrate, a first terminal coupled to the signal line, a second terminal coupled to a second bitline, a control terminal coupled to the wordline, and a dielectric layer between the substrate of the second charge trap transistor and the control terminal of the second charge trap transistor. Charges are either trapped to or detrapped from the dielectric layer of the first charge trap transistor when writing data to the memory cell.
机译:存储单元包括第一电荷陷阱晶体管和第二电荷陷阱晶体管。第一电荷陷阱晶体管具有衬底,耦合到第一位线的第一端子,耦合到信号线的第二端子,耦合到字线的控制端子以及形成在第一电荷陷阱晶体管的衬底与衬底之间的介电层。第一电荷陷阱晶体管的控制端子。第二电荷陷阱晶体管具有衬底,耦合到信号线的第一端子,耦合到第二位线的第二端子,耦合到字线的控制端子以及在第二电荷陷阱晶体管的衬底和晶体管之间的介电层。第二电荷陷阱晶体管的控制端子。当向存储单元写入数据时,电荷或者被捕获到第一电荷捕获晶体管的电介质层中,或者被捕获。

著录项

  • 公开/公告号US2020105338A1

    专利类型

  • 公开/公告日2020-04-02

    原文格式PDF

  • 申请/专利权人 KNERON (TAIWAN) CO. LTD.;

    申请/专利号US201916553109

  • 申请日2019-08-27

  • 分类号G11C11/412;H01L29/792;H01L27/088;G11C11/419;

  • 国家 US

  • 入库时间 2022-08-21 11:20:01

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