A METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON MICROSCOPE FOR PRECESSION ELECTRON DIFFRACTION DATA MAPPING

• 1. 用于自动对准扫描透射电子显微镜以便旋进电子衍射数据映射的方法 [P] . 中国专利： CN110310877A . 2019-10-08
• 2. 半导体线宽测量扫描电子显微镜的自动镜头校正方法 [P] . 中国专利： CN101387832A . 2009-03-18
• 3. A method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping [P] . 韩国专利： KR20190110483A . 2019-09-30

  机译： 一种自动对准扫描透射电子显微镜以进动电子衍射数据作图的方法

• 4. METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON MICROSCOPE FOR PRECESSION ELECTRON DIFFRACTION DATA MAPPING [P] . 美国专利： US2019295810A1 . 2019-09-26

  机译： 自动校正扫描电子显微数据以进行电子衍射数据映射的方法

• 5. METHOD FOR AUTOMATICALLY ALIGNING SCANNING TRANSMISSION ELECTRON MICROSCOPE FOR PRECESSION ELECTRON DIFFRACTION DATA MAPPING [P] . 日本专利： JP2019194975A . 2019-11-07

  机译： 自动校正扫描电子衍射数据以进行电子衍射数据映射的方法

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