首页> 外国专利> METHOD FOR DEPOSITING Ti-Te FILM BY ALD, MULTILAYER PHASE-CHANGE STRUCTURE INCLUDING Ti-Te BARRIER FILM AND PHASE-CHANGE MEMORY DEVICE INCLUDING SAME

METHOD FOR DEPOSITING Ti-Te FILM BY ALD, MULTILAYER PHASE-CHANGE STRUCTURE INCLUDING Ti-Te BARRIER FILM AND PHASE-CHANGE MEMORY DEVICE INCLUDING SAME

机译:通过ALD沉积包括Ti-Te势垒膜的多层相变结构和包含相同相变存储器的Ti-Te膜的方法

摘要

Provided are a method for depositing a Ti-Te film by atomic layer deposition (ALD), a Ti-doping method by ALD of a phase-change material film, a multilayer phase-change structure including a Ti-Te barrier film and a phase-change memory device. In the phase-change memory device, a selection device and a memory device are selectively designed by Ti-doping concentration control.;COPYRIGHT KIPO 2020
机译:提供通过原子层沉积(ALD)沉积Ti-Te膜的方法,通过ALD的相变材料膜的Ti掺杂方法,包括Ti-Te势垒膜和相的多层相变结构-更改存储设备。在相变存储器件中,选择器件和存储器件是通过Ti掺杂浓度控制来选择性设计的。COPYRIGHT KIPO 2020

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