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Electrodeless measuring apparatus for electrode mobility Electrodeless measuring apparatus for hole mobility Electrodeless measuring method for electrode mobility and Electrodeless measuring method for hole mobility
Electrodeless measuring apparatus for electrode mobility Electrodeless measuring apparatus for hole mobility Electrodeless measuring method for electrode mobility and Electrodeless measuring method for hole mobility
A method for measuring electron mobility according to the present invention, which is performed by an apparatus comprising a chamber forming a sealed space, an electron gun provided in the chamber, and a metal sample disposed opposite to the electron gun in the sealed space, comprises: an electron irradiation step of irradiating the metal sample with electrons by the electron gun; a sample current measurement step of applying a voltage to the metal sample to measure a sample current obtained in the metal sample according to the applied voltage; a secondary electron current calculation step of calculating a secondary electron current through the measured sample current; and an effective incident current definition step of defining the sum of the measured sample current and the calculated secondary electron current as an effective incident current.
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