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Thickness measurement apparatus, thickness evaluation apparatus, thickness measurement method and thickness evaluation method

机译:厚度测量装置,厚度评估装置,厚度测量方法和厚度评估方法

摘要

PROBLEM TO BE SOLVED: To provide a thickness measurement device capable of further accurately evaluating thickness to the perimeter of piping.SOLUTION: A thickness measurement device comprises a plurality of ultrasonic probes for detecting thickness of piping 1, a first feed amount measurement device for measuring a first feed amount which is a feed amount in a circumferential direction Y of the piping 1 and a second feed amount measurement device for measuring a second feed amount which is a feed amount in a pipe axial direction X of the piping 1. The plurality of ultrasonic probes are arrayed in a zigzag manner in the pipe axial direction X of the piping 1. The array length is set to be longer than a feed pitch P in the pipe axial direction X obtained by making a round of the piping 1 in the circumferential direction Y. The thickness measurement device comprises a measurement position computation unit 17 for computing a position of thickness measurement by the ultrasonic probes on the basis of a measurement result from the first feed amount measurement device and a measurement result from the second feed amount measurement device.SELECTED DRAWING: Figure 7
机译:解决的问题:提供一种能够进一步准确评估管道周边厚度的厚度测量装置。解决方案:厚度测量装置包括用于检测管道1厚度的多个超声波探头,用于测量的第一进料量测量装置第一供给量和第二供给量测量装置,该第一供给量是在管道1的圆周方向Y上的供给量,该第二供给量测量装置用于测量第二供给量,该第二供给量是在管道1的管轴向X上的供给量。超声波探头在管道1的管道轴向X上呈Z字形排列。阵列长度被设定为比通过在管道1的圆周上绕一圈而获得的管道轴向X上的进给间距P长。厚度测量装置包括测量位置计算单元17,该测量位置计算单元17用于计算超声波探头在厚度方向上的厚度测量位置。以第一进给量测量设备的测量结果和第二进给量测量设备的测量结果为基础。图7

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