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SEMICONDUCTOR SEMICONDUCTOR LAYER STRUCTURE OF GROUP III-V OR II-VI COMPRISING CRYSTALLINE STRUCTURE WITH CUBIC OR HEXAGONAL MESH

机译:具有立方或六角网状结构的III-V或II-VI组晶体结构的半导体层结构

摘要

A semi-conductor structure (100) comprising: - a substrate (102), - a first layer (106) of AIxGayln(1-x-y)N disposed on the substrate, - stacks (107, 109) of several second and third layers (108, 110) alternating against each other, between the substrate and the first layer, - a fourth layer (112) of AIxGayln(1-x-y)N, between the stacks, - a relaxation layer of AIN disposed between the fourth layer and one of the stacks, and, in each of the stacks: - the level of Ga of the second layers increases from one layer to the next in a direction from the substrate to the first layer, - the level of Ga of the second layers is constant or decreasing from one layer to the next in said direction, the average mesh parameter of each group of adjacent second and third layers increasing from one group to the next in said direction, - the thickness of the second and third layers is less than 5 nm.
机译:半导体结构(100),包括:-衬底(102);-设置在该衬底上的AlxGayln(1-xy)N的第一层(106);-多个第二和第三层的堆叠(107、109) (108、110)在衬底和第一层之间彼此交替;-叠层之间的AlxGayln(1-xy)N的第四层(112);-设置在第四层和第二层之间的AlN的弛豫层。一个叠层,并且在每个叠层中:-第二层的Ga的水平在从衬底到第一层的方向上从一层到下一层增加,-第二层的Ga的水平为在所述方向上从一层到下一层恒定或减小,相邻的第二层和第三层的每组的平均网格参数在所述方向上从一组到下一层增加-第二层和第三层的厚度小于5纳米

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