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DEVICE FOR ANALYZING ELASTIC CONSTANT PLASTIC METALS WITH LOW PLASTICITY AND ALLOYS AT HIGH TEMPERATURE
DEVICE FOR ANALYZING ELASTIC CONSTANT PLASTIC METALS WITH LOW PLASTICITY AND ALLOYS AT HIGH TEMPERATURE
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机译：低塑性弹性常数塑性金属及高温合金的分析装置
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摘要
FIELD: test equipment.;SUBSTANCE: invention relates to the analysis of strength properties of materials by optical measuring means by applying compressive static loads to them. Device comprises a base with a fixed plate and a movable plate. Laser, beam splitter and mirror are arranged on the base. Beam reflected from the beam splitter is sent to the interferometer of longitudinal deformations, and the beam transmitted through the beam splitter is directed by the mirror into the interferometer of transverse deformations. Device uses four-way interferometers, each of which includes a polarized beam splitter, dividing the laser beam into a working and reference beam, two retro reflectors, a quarter-wave and a polarization plate. In the interferometer of transverse deformations there are six bypass mirrors, guide the beam of the working arm onto the two opposite mirror-polished lateral surfaces of the sample of rectangular cross-section. In the working arm of the longitudinal strain interferometer there is a mirror-polished surface of the movable plate facing the fixed plate, and two mirror-polished inclined at an angle of 45 degrees of the surface of the fixed plate, the centers of which are in the same plane with the longitudinal axis of the sample being examined symmetrically with respect to it. Electrodes connected to the direct current source are installed on the outer sides of the plates. Semiconductor layer is placed between one of the plates and the corresponding electrode. Semiconductor layer can also be placed between the second plate and the second electrode. Sample is placed between plates, preload is set, electric current is passed between the electrodes. After heating the sample, it is deformed, the loading force and temperature of the sample are continuously recorded with a thermocouple. Count of the displaced interference lines is made by means of consecutively arranged two collimators, two diaphragms, two photodetectors and an electronic processing circuit after the interferometers along the reflected rays of the working arms.;EFFECT: technical result is an increase in the accuracy of measurements of the elastic constants of low-plastic metals and alloys at high temperatures.;1 cl, 5 dwg
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